EPC, the leader in GaN, announces the release of its Phase 17 Reliability Report, further solidifying GaN’s position as a highly reliable technology.

EL SEGUNDO, CA, CA, UNITED STATES, March 11, 2025 /EINPresswire.com/ -- Efficient Power Conversion (EPC), the leader in gallium nitride (GaN) power devices, announces the release of its Phase 17 Reliability Report, further solidifying GaN’s position as a highly reliable technology for power electronics, automotive, AI, space, and industrial applications.

The latest reliability report introduces expanded lifetime models, mission-specific reliability projections, and new physics-based wear-out mechanisms, providing engineers with more accurate and practical reliability data for GaN power devices.

Key Highlights of the Phase 17 Reliability Report:

• Expanded Gate Lifetime Model: Incorporates gate leakage current effects across voltages and temperatures, leading to enhanced impact ionization modeling.

• Repetitive Transient Gate Overvoltage Testing: Develops and validates a 7 V gate overvoltage rating, addressing resonance-like transient stress in real-world applications.

• Enhanced Drain Overvoltage Robustness: Further validation of GaN’s superior durability under repetitive transient drain-source overvoltage conditions.

• New Pulsed Current Rating Data: Extends testing to over 100 million pulses, proving minimal parametric shifts in Gen-5 and Gen-6 GaN devices.

• Comprehensive Thermomechanical Lifetime Model: Now includes power cycling (PC) modeling, essential for high-stress applications like automotive and AI power systems.

• Mission-Specific Reliability Insights: Expanded analysis for solar, lidar, and DC-DC conversion applications, allowing engineers to fine-tune their designs for long-term operation.

Driving GaN Forward in Reliability & Performance
EPC’s test-to-fail methodology continues to push GaN technology beyond traditional silicon MOSFETs. By integrating real-world stress conditions into advanced lifetime models, the Phase 17 report ensures more accurate reliability projections for next-generation power applications.

“This report advances GaN reliability modeling with mission-specific projections and new lifetime models, enabling engineers to integrate GaN into high-power, efficient, and robust designs with confidence,” said Alex Lidow, EPC CEO and co-founder.

Availability
The EPC Phase 17 Reliability Report is available for download at epc-co.com. For additional technical details, Ask a GaN Expert.

Renee Yawger
Efficient Power Conversion
+1 9086199678
email us here
Visit us on social media:
Facebook
X
LinkedIn

Legal Disclaimer:

EIN Presswire provides this news content "as is" without warranty of any kind. We do not accept any responsibility or liability for the accuracy, content, images, videos, licenses, completeness, legality, or reliability of the information contained in this article. If you have any complaints or copyright issues related to this article, kindly contact the author above.