SMART High Reliability Solutions Announces HRS-M4P Solid State Drive
With up to 2TB of storage, the ruggedized, security-rich HRS-M4P is designed specifically for demanding applications while mitigating against single even upsets (SEUs).
GILBERT, Ariz., Dec. 18, 2018 (GLOBE NEWSWIRE) -- SMART High Reliability Solutions (“SMART HRS”), a subsidiary of SMART Global Holdings, Inc., (NASDAQ: SGH), and a provider of current and next-generation solid state storage solutions specializing in ruggedized, high-performance and high-capacity solid state drives (“SSDs”) for defense, aerospace and industrial markets, today announced its HRS-M4P 2.5” SATA SSD is available in volume production quantities for customers requiring ultimate performance coupled with data security at altitudes of up to 80,000 feet. The M4P is a security-rich, ruggedized, high-performance SSD loaded with data protection/elimination, environmental and reliability features. The M4P SSD also meets mil-erase sequence standards, and because it’s a multi-level cell (MLC) technology solution, it’s a durable and economical choice for demanding defense and aerospace applications.
Piggybacking off of its successful predecessor, the HRS-M4, the MLC based HRS-M4P is available in capacities up to 2TB, and has read/write performance of 500MB/s and 260MB/s respectively. The M4P is designed with key features including an industrial temperature operation of -40 to +85 degrees Celsius, a highly-ruggedized enclosure designed to protect against harsh elements while withstanding vibration and shock up to 1500g. Design options include staking, conformal coating, leaded process, extended burn-in and specialty firmware if the applications demands.
Security features include AES 256b, write protection, and an external HW erase trigger. The M4P also features Mil erase sequencing that adheres to NSA-9-12, DoD NISPOM, and other specific NSA and armed forces security and encryption criteria.
One of the most important features of the M4P is that it guards against single event upsets (SEUs) which can be a problem during high-altitude operations. An SEU is a change of state in a device caused by one single ionizing particle striking a sensitive node in a micro-electronic device. This is commonly known as a “bit-flip” which can cause an error in device output or operation.
“Radiation encountered during high-altitude applications can change bits in memory. Defense customers requiring airborne data storage can’t live with these SEUs; it can mean loss of data,” stated Mike Guzzo, General Manager of SMART HRS, “Data protection is paramount and it’s imperative that we mitigate these SEUs and secure data during mission critical applications.”
Review and compare the HRS-M4P product specifications, feature sets, capabilities and more vs SMART HRS’ entire ruggedized product line by viewing the Product Comparison Chart which lists all of SHRS’ product specifications and attributes.
For additional information on the new HRS-M4P and more from SMART High Reliability Solutions, please visit www.smartH.com.
Find and follow SMART HRS on Twitter under the handle @milssd, or on LinkedIn at http://www.linkedin.com/company/smart-high-reliability-solutions
About SMART High Reliability Solutions
SMART High Reliability Solutions (SHRS) is a market pioneer of secure, ruggedized solid state drives (SSDs) and continues to be a technology leader, employing current and next-generation defense-focused designs. Utilizing Flash technology backed with proven world-class support, SHRS designs and manufactures high-performance military and industrial SSDs with additional attributes such as encryption, secure data elimination and write-protect features. SHRS understands and solves customers’ key requirements, leveraging its long heritage of established, generational and robust SSD design. SMART High Reliability Solutions is a subsidiary of SMART Global Holdings, Inc. See www.smartH.com for more information.
Contact:
Jim Piroli
SMART High Reliability Solutions
(510) 624-5354
jim.piroli@smartH.com
A photo accompanying this announcement is available at http://www.globenewswire.com/NewsRoom/AttachmentNg/153f4f38-e846-4e09-8136-4a85def24248
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